Buckle depression as a signature of Young’s modulus mismatch between a film and its substrate

R. Boijoux (1, 2) , G. Parry (1) , C. Coupeau (2)

1 SIMaP - Science et Ingénierie des Matériaux et Procédés
2 PPrime [Poitiers] - Institut Pprime [UPR 3346]

The buckling structures of rigid films on soft substrates exhibit a “mexican hat” shape characterized by a nanometer scale depression at both edges. Based on finite elements simulations, a mathematical formulation is proposed to extract the elastic modulus mismatch between the film and its substrate, from the fine characterization of the buckle morphology.

Domains: Mechanics of materials [physics.class-ph]

R. Boijoux, G. Parry, C. Coupeau. Buckle depression as a signature of Young’s modulus mismatch between a film and its substrate. Thin Solid Films, 2018, 645, pp.379-382. ⟨10.1016/j.tsf.2017.11.011⟩. ⟨hal-01957123⟩